DFTS Program

Please note that the program displayed on this webpage is preliminary and subject to change. We are currently in the process of finalizing the details, and adjustments may occur as we continue to refine our offerings. We appreciate your understanding and encourage you to check back regularly for the most up-to-date information. Thank you for your interest!

Tuesday, Oct 21

08:30

09:00

10:00

11:00

12:00

13:00

14:00

15:00

16:00

17:00

18:00

19:00

08:30

Registration

09:00

Opening

09:30

A DFT Guide to Kill Your 3D Product and Ruin Your Company

09:30 - 10:30 Keynote

Keynote by Martin Keim

10:30

Coffee Break

10:50

Session 1: Memories and ECCs

10:50 - 12:10 Regular Session

10:50 Memory Dynamic Faults and Array-Level Faults Detector in Digital Test Environment
Dorian Ronga, Eric Faehn, Patrick Girard and Arnaud Virazel

11:10 Soft Error Study on Avanced Process Node DRAMS at Component and System Level
Huifang Jiao, Xiaojie Wang, Xiaomeng Qi, Hongliang Pu and Zhiliang Hu

11:30 Approximate Memory Protection Against Double-Adjacent Bit Errors with Low Redundancy SEC-DAEC Codes
Wenqi Zhang, Shanshan Liu, Yin Cheng, Zhen Gao, Pedro Reviriego and Fabrizio Lombardi

11:50 On the Hardware Implementation of Lala's 64-bit SECDED Codes
Frédéric Pétrot and César Fuguet

12:00 Improved encoding and decoding of optimal m-out-of-n codes
Benjamin Glätzer and Alexander Benedict Behrens

12:10

Lunch

13:40

Special Session 1: Effective Design, Modeling and Testing Techniques for Digital Computing-in Memories with MAC Function

13:40 - 14:40 Special Session

Jin Fu Li, Chun-Lung Hsu, Shih-Hsu Huang, Yu-Guang Chen, Yung-Chi Chia, Ting-Yi Wu, Wei-Hung Lin and Chen-Yi Wu

14:40

Session 2: Emerging Technologies

14:40 - 15:40 Regular Session Chair: Toshinori Hosokawa

14:40 A Fault-tolerant Voter Circuit in NEM Technology
Dominik Rudolf, Ardavan Elahi, Axel Jantsch and Dinesh Pamunuwa

15:00 Dependability Analysis and Assessment of Approximate Membership Query XOR Filters
Jinhua Zhu, Zhen Gao, Pedro Reviriego, Shanshan Liu and Fabrizio Lombardi

15:20 Analysis of Repair Structures for Chiplet Interfaces
Théo Bermond and Adrian Evans

15:40

Coffee Break

16:00

Session 3: Security and Advanced Test Techniques

16:00 - 17:20 Regular Session

16:00 A Neural Network-Based Classifier for Glitch Detection in Clock Traces
Asier Gambra, Durba Chatterjee, Unai Rioja, Igor Armendariz and Lejla Batina

16:20 Laser Fault Injection on RO-based PUFs Implemented on FPGA
Aghiles Douadi, Elena-Ioana Vatajelu, Paolo Maistri, David Hely, Vincent Beroulle, Giorgio Di Natale and Jean-Max Dutertre

16:40 PBO-Based Pattern Replacement for Compacting Diagnostic Patterns to Achieve Complete Diagnostic Resolution
Tatsuya Aono, Toshinori Hosokawa, Masayoshi Yoshimura, Koji Yamazaki and Masayuki Arai

17:00 Functional Synchronization for Online Testing of Identical Logic Blocks
Irith Pomeranz

17:10 LAD-IXoC: Hardware Loop Attack Detection with Integrated Xor Filter and CMS
Roberto Boris Martinez-Aguilar, Alessandro Palumbo, Pedro Reviriego, Ruben Salvador and David Larrabeiti

17:20

Special Session 2: Formal Verification Techniques and Reliability Methods for RRAM-based Computing-in-Memory

17:20 - 18:20 Special Session

Chandan Kumar Jha, Sumit Kumar Jha, Ulf Schlichtmann and Rolf Drechsler

18:20

Welcome Reception

Wednesday, Oct 22

08:30

09:00

10:00

11:00

12:00

13:00

14:00

15:00

16:00

17:00

18:00

19:00

20:00

08:30

Advancements in the security of ultra low-cost flexible electronics

08:30 - 09:30 Keynote

Keynote by Nele Mentens

09:30

Coffee Break

09:50

Session 4: Processors and GPUs

09:50 - 11:00 Regular Session

09:50 Reliability assessment of AMD MicroBlaze-V TMR architecture using fault injection
Jorge Cano-Páez, Luis Entrena and Almudena Lindoso

10:10 Using RISC-V Extensions to Support Software-Implemented Hardware Fault Tolerance
Brent De Blaere, Jens Vankeirsbilck and Jeroen Boydens

10:30 Optimizing Software Self-Test Pattern Generation for Specific Components
Jad Al Halabi, Melis Cetinkaya, Endri Kaja, Wolfgang Ecker and Mounika Vaddeboina

10:40 Reliability and Performance Evaluation of a Fault-Tolerant MPSoC Interconnection Architecture
Thiago Rausch, Wesley Grignani, Luigi Dilillo and Douglas Melo

10:50 Flexible Software-Only Diverse Redundancy on COTS GPUs for Safety-Related Kernels
Nikolaos Andriotis, Alejandro Serrano Cases, Sergi Alcaide, Francisco J. Cazorla and Jaume Abella

11:00

Special Session 3: Application of Functional Verification Techniques in Hardware Trust

11:00 - 12:00 Special Session

Mohammad Reza Heidari Iman, Rolf Drechsler, Chandan Kumar Jha, Ali Azarpeyvand, Tara Ghasempouri, Sharjeel Imtiaz, Jaan Raik, Samuele Germiniani, Daniele Nicoletti, Graziano Pravadelli and Giorgio Di Natale

12:00

Lunch

13:30

Special Session 4: FeMFET-based High Performance, Ultra-Low Power Memory Cells for Reliable State Retention of Dataflow Networks

13:30 - 14:30 Special Session

Basile Darne, Abrarul Karim, Paul-Antoine Matrangolo, Joachim Falk, Ian O'Connor, Cédric Marchand, Alberto Bosio and Jürgen Teich

14:30

Coffee Break

14:50

Special Session 5: Beyond the Black Box: Advancing Transparency, Explainability, and Trust in AI for Space

14:50 - 15:50 Special Session

Gianluca Furano, Alessandra Menicucci, Livia Manovi, Riccardo Rovatti, Mauro Mangia, Fabian Schiemenz and Riccardo Gallon

15:50

Gala Dinner and Social Event

Thursday, Oct 23

09:00

10:00

11:00

12:00

13:00

14:00

15:00

09:00

Radiation-Tolerant System-on-Chip Devices for Space Applications

09:00 - 10:00 Keynote

Keynote by Jan Andersson

10:00

Coffee Break

10:20

Session 5: Radiation Effects and Safety-Critical Applications

10:20 - 11:40 Regular Session Chair: Marco Ottavi

10:20 HW/SW Co-Design of a Reliable Deep Space System exploiting Application-profiled RAM Scrubbing
Nicola di Gruttola Giardino, Paolo Bernardi, Sabrina Corpino and Fabrizio Stesina

10:40 Low Overhead Self-Correction in Radiation-Hardening-by-Design Triple Modular Redundancy Flip-Flops for Space Applications
Oliver Schrape, Anselm Breitenreiter, Li Lu, Marko Andjelkovic, Ernesto Pun-García, Marisa Lopez-Vallejo and Milos Krstic

11:00 Compact SER Models for Line-Source-Induced Charge Collection Using Model Order Reduction
Pavlos Stoikos, Olympia Axelou, Georgios-Ioannis Paliaroutis, Pelopidas Tsoumanis, Anuj Pathania and George Floros

11:20 Automatic Data Redundancy in Safety-Critical Applications Using Trait-Based Code Transformation
Mohammadreza Amel Solouki, Corrado De Sio, Maurizio Rebaudengo and Jacopo Sini

11:30 Radiation Effects on NVIDIA Jetson SoCs: Insights from Heavy Ion Irradiation
Ivan Rodiguez-Ferrandez, Eric Rufart-Blasco, Leonidas Kosmidis, Maris Tali and David Steenari

11:40

Special Session 6: Simulation Methodologies and Experiments for Reliability Analysis of Devices in Radiation Harsh Environments

11:40 - 12:40 Special Session

Luigi Dilillo, Wesley Grignani and Nikos Chatzivangelis

12:40

Lunch

14:10

Session 6: Machine Learning Approaches

14:10 - 15:20 Regular Session

14:10 APSS Metrics for Fault Detection: Area, Position, Symmetry, and Shape in Image Segmentation
Vittorio Turco, Lorenzo Fezza, Annachiara Ruospo, Ernesto Sanchez and Matteo Sonza Reorda

14:30 Algorithmic Strategies for Sustainable Reuse of Neural Network Accelerators with Permanent Faults
Youssef Ait Alama, Sampada Sakpal, Ke Wang, Razvan Bunescu, Avinash Karanth and Ahmed Louri

14:50 A Multi-Modal Attention-Based Framework for Good Die in Bad Neighborhood Methodology
Mohammad Ershad Shaik, Abhishek Kumar Mishra, Nagarajan Kandasamy and Nur A Touba

15:10 Does Fault Tolerance Safeguard DNNs Against Bitflip Attacks? A Case Study
Mohammad Hasan Ahmadilivani, Yuto Kobayashi, Jaan Raik, Masoud Daneshtalab and Maksim Jenihhin