Much of the security concerns during the design of modern system on chips (SoCs) or
system-in-package (SiPs) have to do with design mistakes, lack of understanding of
security vulnerabilities and the many attack surfaces and vectors that exist.
This presentation will discuss challenges to securing silicon development lifecycle,
makes a case for automation to lower the development cost, offers solutions to
engineers and practitioners, and present research challenges and opportunities for academics.
In 2019 the second edition of the ISO26262 standard for functional safety for vehicles has
been released, which included the new part 11 specifically dedicated to interpretation of
the standard to semiconductors. Using a RISC V processor as an example we will review how
the approach to functional safety has evolved in these past years, the level of analysis,
the solutions and the challenges, touching random failure, systematic failure, design environment,
relationships to related fields, such as test and reliability.
This keynote talk covers Radiation Effects in Field Programmable Gate Arrays (FPGAs)
and Systems on Chips (SoCs). The ability to implement complex designs and evolving
algorithms in reconfigurable devices makes FPGAs attractive for many Terrestrial
and Space applications, compared to fixed function Application Specific Integrated
Circuits (ASICs). This talk will address the basics of SRAM and non-volatile-based
FPGA architecture and their evolution to modern/complex SoCs and Adaptive Compute
Acceleration Platform (ACAP) devices. Then we will discuss Single Event Effects (SEE)
and Total Ionizing Dose (TID) mechanisms, errors classification, mitigation,
test methodologies, and representative results. The final section will focus
on challenges and potential paths to address requirements for next-gen Terrestrial
(telecom, automotive, data centers, avionics, etc.), defense, and space markets.