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DFT2020

DFT 2020

The 33rd IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, October 19 – October 21, 2020, ESA-ESRIN, Frascati, Italy

  • Call for Contributions
    • Call for papers
    • Call for Special Sessions
  • Submissions
  • Camera Ready
  • Program
    • Program
    • Instructions for speakers
  • Keynotes
  • Attend
    • Registration
  • Committees
  • History
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Conference Registration

Type FEE
Regular IEEE Member EU€ 150
Regular Non-Member EU€ 180
Student IEEE Member EU€ 30
Student Non-Member EU€ 40
Life IEEE Member EU€ 85

Student status must be verified by emailing a copy of a valid student card or a letter from the university to Marco Rovatti marco.rovatti@esa.int

[For Authors]: The registration for authors is due in SEPTEMBER 25, 2020. At least one AUTHOR for each accepted paper is required to register as a REGULAR attendee (Regular IEEE Member or Regular Non-Member). When registering, please refer to the submission PAPER ID. Papers will not be published in the proceedings unless one of the authors has registered (as REGULAR) and payment of the registration fee has been received.

[For Non-Authors]: There is no difference from early and late registration.

Click here to reach the registration web site.